Publications

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J. Fraxedas, Vollmer, A., Koch, N., de Caro, D., Jacob, K., Faulmann, C., and Valade, L., Characterization of Charge States in Conducting Organic Nanoparticles by X-ray Photoemission Spectroscopy, Materials, vol. 14, p. 2058, 2021.
J. Fraxedas, Schütte, M., Sauthier, G., Tallarida, M., Ferrer, S., Carlino, V., and Pellegrin, E., In situ XPS analysis of the electronic structure of silicon and titanium thin films exposed to low-pressure inductively-coupled RF plasma, Applied Surface Science, vol. 542, p. 148684, 2021.
P. Ferrando-Villalba, Takegami, D., Abad, L., Ràfols-Ribé, J., Lopeandía, A., Garcia, G., and Rodríguez-Viejo, J., {Growth monitoring with sub-monolayer sensitivity via real time thermal conductance measurements}, ArXiv e-prints, 2018.
P. Ferrando-Villalba, Pérez-Marín, A. Pablo, Abad, L., Dalkiranis, G. Gonçalves, Lopeandía, A. F., Garcia, G., and Rodriguez-Viejo, J., Measuring Device and Material ZT in a Thin-Film Si-Based Thermoelectric Microgenerator, Nanomaterials, vol. 9, p. 653, 2019.
P. Ferrando-Villalba, Takegami, D., Abad, L., Ràfols-Ribé, J., Lopeandía, A., Garcia, G., and Rodríguez-Viejo, J., Growth Monitoring With Submonolayer Sensitivity Via Real-Time Thermal-Conductance Measurements, Phys. Rev. Applied, vol. 12, p. 014007, 2019.
P. Ferrando-Villalba, Chen, S., Lopeandia, A. F., Alvarez, F. X., Alonso, M. I., Garriga, M., Santiso, J., Garcia, G., Goñi, A. R., Donadio, D., and Rodríguez-Viejo, J., Beating the Thermal Conductivity Alloy Limit Using Long-Period Compositionally Graded Si1–xGex Superlattices, The Journal of Physical Chemistry C, vol. 124, pp. 19864-19872, 2020.
P. Ferrando-Villalba, D’Ortenzi, L., Dalkiranis, G. G., Cara, E., Lopeandia, A. F., Abad, L., Rurali, R., Cartoixà, X., De Leo, N., Saghi, Z., Jacob, M., Gambacorti, N., Boarino, L., and Rodríguez-Viejo, J., Impact of pore anisotropy on the thermal conductivity of porous Si nanowires, vol. 8, p. 12796, 2018.
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