Grup de Nanomaterials i Microsistemes | Webpage of GNaM Grup de Nanomaterials i Microsistemes

2008

Torrens-Serra J, Roth S, Rodriguez-Viejo J, Clavaguera-Mora MT. Effect of Nb in the nanocrystallization and magnetic properties of FeNbBCu amorphous alloys. [Internet]. 2008;. http://dx.doi.org/10.1016/j.jnoncrysol.2008.05.057

Garcia G, Burriel M, Bonanos N, Santiso J. Electrical conductivity and oxygen exchange kinetics of La2NiO4 thin films grown by Chemical vapour deposition. 2008;.

Clavaguera-Mora MT, Torrens-Serra J, Rodriguez-Viejo J. Primary crystallization in Fe65Nb10B25 metallic glass. [Internet]. 2008;. http://dx.doi.org/10.1016/j.jnoncrysol.2008.05.079

Alvarez-Quintana J, Rodriguez-Viejo J. Interfacial effects on the thermal conductivity of a-Ge thin films grown on Si substrates. [Internet]. 2008;. http://dx.doi.org/10.1115/1.4000052

Sepúlveda A, Lopeandia AF, Domenech-Ferrer R, Garcia G, Pi F, Rodriguez-Viejo J, et al.. Microchip power compensated calorimetry applied to metal hydride characterization. [Internet]. 2008;. http://dx.doi.org/10.1016/j.ijhydene.2008.03.047

Torrens-Serra J, Roth S, Rodriguez-Viejo J, Clavaguera-Mora MT. Structure and thermomagnetic properties of powders produced from melt spun FeNbBCu ribbons. [Internet]. 2008;. http://dx.doi.org/10.1016/j.jnoncrysol.2008.05.007

2007

Fontana M, Arcondo B, Clavaguera-Mora MT, Clavaguera N. Mechanisms controlling primary crystallisation of Ga20Te80 glasses. [Internet]. 2007;. http://dx.doi.org/10.1016/j.jnoncrysol.2007.03.007

Torrens-Serra J, Rodríguez-Viejo J, Clavagera-Mora MT. Influence of composition in the crystallization process of Fe75-xNb10B15+x metallic glasses. [Internet]. 2007;. http://dx.doi.org/10.1016/j.jnoncrysol.2006.12.052

González-Silveira M, Rodríguez-Viejo J, Clavaguera-Mora MT. Time resolved x-ray reflectivity study of interfacial reactions in Cu/Mg thin films during heat treatment. [Internet]. 2007;. http://link.aps.org/doi/10.1103/PhysRevB.75.075419

Alvarez-Quintana J, Rodríguez-Viejo J. Extension of the 3w method to measure the thermal conductivity of thin films without reference sample. [Internet]. 2007;. http://dx.doi.org/10.1016/j.sna.2007.01.013

Pages

Campus d'excel·lència internacional U A B