Publications (most important in recent years, see DBLP, Academic, Scholar in Team pages)
C
B. León, Franco, D., Rexachs, D., and Luque, E.,
“Characterization of I/O Patterns generated by Fault Tolerance in HPC environments”, in
Int'l Conf. Par. and Dist. Proc. Tech. and Appl. PDPTA'18., Las Vegas, USA, 2018.