Analyzing the Parallel I/O Severity of MPI Applications

TitleAnalyzing the Parallel I/O Severity of MPI Applications
Publication TypeConference Paper
Year of Publication2017
AuthorsMendez, S, Rexachs, D, Luque, E
Conference NameProceedings of the 17th IEEE/ACM International Symposium on Cluster, Cloud and Grid Computing
PublisherIEEE Press
Conference LocationMadrid, Spain
ISBN Number978-1-5090-6610-0
KeywordsHPC Systems, I/O Severity, I/O system, Parallel File System, Parallel I/O
URLhttp://dl.acm.org/citation.cfm?id=3101260
DOI10.1109/CCGRID.2017.45
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