Characterization of I/O Patterns generated by Fault Tolerance in HPC environments

TitleCharacterization of I/O Patterns generated by Fault Tolerance in HPC environments
Publication TypeConference Paper
Year of Publication2018
AuthorsLeón, B, Franco, D, Rexachs, D, Luque, E
Conference NameInt'l Conf. Par. and Dist. Proc. Tech. and Appl. PDPTA'18.
Date Published08/2018
PublisherCSREA Press
Conference LocationLas Vegas, USA
ISBN Number1-60132-487-1
KeywordsCheckpoint, Fault Tolerance, HPC, I/O, Rollback Recovery
URLhttps://csce.ucmss.com/cr/books/2018/LFS/CSREA2018/PDP3611.pdf
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